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We are thrilled to introduce a new heliX Adapter Chip Test Analysis, major updates to batch data analysis within the Manual Analysis, alongside a new Drift Correction Operation for both switchSENSE as well as RT-IC users, all aimed at elevating the quality and utility of data analysis, interpretation, and export.

New heliX Adapter Chip Test Analysis

We are thrilled to introduce the new heliX Adapter Chip Test Analysis, a comprehensive solution designed to swiftly assess the quality of your heliX Adapter Chips. This analysis is composed of four quality checks for evaluating data obtained from your chip.

First, we confirm that ligand injection results in the expected jump in fluorescence.
Next, all relevant inflection points are identified during voltage calibration.
We then ensure that the relative amplitudes on both spots surpass the given threshold for this specific chip.
Lastly, we verify that all essential information can be read from the RFID tag embedded within the chip.

Each quality check comes with visual representations of the relevant data, enabling you to confirm the chip’s quality with ease.
The results table provides raw numeric values for inflection points, relative amplitudes, and other pertinent quantities.
Additionally, an image of the chip surface recorded during testing is available for visual confirmation of its integrity.

When issues are detected within the Adapter Chip Test data during quality checks, these problems will be clearly identified in both the failing check and the final verdict. The verdict will outline the specific issue (e.g., Relative amplitude(s) too low) along with a suggested list of possible reasons, ranked from most to least likely. Each reason will include recommendations for resolving the detected issue.

The new heliX Adapter Chip Test Analysis is your go-to tool for evaluating the quality of your heliX Adapter Chips. The data generated through heliX Adapter Chip Test assays remains compatible with the existing Chip Status Analysis. However, be aware that the Chip Status Analysis assesses less data and lacks automatic quality checks. For a comprehensive assessment of your heliX Adapter Chip’s quality, we strongly recommend utilizing the new heliX Adapter Chip Test Analysis.

Manual Analysis Upgrade for Batch Analyses

The expanded capabilities of our Manual Analysis system now cater to the efficient processing of multiple similar datasets (batch analysis). Inspired by the versatile data acquisition of our heliX and heliX^cyto line instruments, we are thrilled to introduce new features that were previously exclusive to Automated Analyses.

Grouped Data Imports

The first significant addition is the ability to automatically group Measurements into Data Sources based on chosen Metadata. Previously, you could only import Measurements as individual Data Sources or combine multiple measurements into one Data Source. With this update, you may now select multiple Measurements and import them grouped into Data Sources based on shared Metadata.

This feature allows for creating distinct Data Sources based on different measurement channels, ligand-sample pairs, or any other combination of available Metadata. Each created Data Source will have a unique name derived from the selected Metadata.

The ability to group measurements by Metadata also introduces the import of measurements with different measurement modes in a single step. Previously, importing measurements with varying modes in a single step was not allowed due to each mode’s distinct configuration options.

With our new Grouped Data Imports feature, we have enabled the import of measurements with different modes by enforcing the grouping based on measurement modes. This way, we ensure that each Data Source is configurable for its respective measurement mode while simplifying the process of importing the data.

Smart Pasting of Analysis Pipelines

Copy-pasting analysis pipelines is a time-saving technique for performing identical or near identical analyses on different datasets. In the past versions, pasted analysis pipelines appeared at a fixed position in the Analysis Scratchpad, leading to inconvenience when focused on an area far away from this fixed position.

With our latest update, we have modified the behavior so that pasted analysis pipelines now appear at the current mouse cursor position. This change in behavior enhances your productivity by reducing the hassle of repeatedly navigating to a distant fixed location.

Analysis pipelines can also be easily copied using the standard copy (Ctrl+C) and paste (Ctrl+V) shortcuts.

A frequent use case of copy-pasting analysis pipelines involves the analysis of data from another Data Source. In earlier versions, this process required two separate steps: first pasting the analysis pipeline, then manually connecting it to your Datasource of interest.

To streamline this process, we have introduced the “Paste and Link selection to” option for Analysis Elements. This allows you to reuse an already created pipeline on another Data Source with a single command.

We have further expanded the ability to paste and link analysis pipelines by enabling their connection to multiple Data Sources. Instead of merely pasting and linking an Analysis Element to a single Data Source, you may now select multiple Data Sources and paste and link independent pipelines for each. For this process, copy the pipeline you wish to paste, select the desired Analysis Elements, and choose “Paste and Link Selection To” from the context menu.

Each selected Analysis Element will be connected to an independent copy of the analysis pipeline.
We refer to this process as Batch Pasting.

Combining our new Batch Pasting process with the Grouped Data Imports creates a powerful workflow for batch analyzing heliX data with custom analysis pipelines. First, import your data according to the desired independent groups (e.g., Sample-Ligand-pairs). Then, build the analysis pipeline on top of one of these created Data Sources until you are satisfied with the results. Lastly, copy and paste the pipeline onto each of the other Data Sources using a single command.

New Operation: Drift Correction

Data analysis frequently encounters minor linear drifts that can distort the underlying signal and compromise accurate interpretations. Identifying and addressing these drifts is crucial for obtaining valid results.

With this objective, we have developed our new Linear Drift Correction Operation. This operation processes user-supplied data by calculating a linear regression using points from the start and end of each curve. Subsequently, it eliminates the detected drift, enabling proper analysis of the corrected signal.

The operation relies on the assumption that data points at the beginning and end of each curve represent a consistent baseline.
However, in scenarios where this assumption is invalid, detected drifts may result in artificial anomalies.

When necessary, users can configure the operation to disregard any points from the end of the curves.
In such cases, successful linear drift removal from the data may become possible.

Please note that this operation caters specifically to correcting a linear signal drift in your data.
It is imperative to meticulously examine any drift prior to correction, as biological or other factors may be responsible for the observed drift.

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Upgrade now to uncover these exciting new features:
the heliX Adapter Chip Test Analysis,
the advanced Drift Correction Operation,
and expanded batch analysis capabilities in the Manual Analysis.

These improvements equip scientists and technical assistants with the tools to analyze results accurately and swiftly, fostering groundbreaking discoveries. Stay tuned as we continually refine and innovate on our heliOS software platform, dedicated to delivering a smooth and enlightening user experience.

Thank you for being a valuable part of our journey to make heliOS more powerful and user-friendly.